Journal: Chempluschem
Article Title: Effect of UV Light Exposure Duration on the Removal of Exfoliation Agent Residues in Two‐Dimensional Perovskite Nanosheets: An AFM Study
doi: 10.1002/cplu.202400678
Figure Lengend Snippet: The median values of all adhesion forces ( F mdn ) measured between the AFM tips and nanofilms with respect to different durations of UV light exposure, and the most probable values ( x o ) of the adhesion forces quantified by fitting lognormal dynamic peak function to the adhesion data. A total of 192 retraction force‐distance curves were analyzed for each of the groups investigated. R 2 values represent the quality of the log‐normal fitting. The S a and S q parameters of the nanofilms are also given below.
Article Snippet: The most probable adhesion force values were determined for each condition by applying a log‐normal probability distribution function to the histograms (SigmaPlot, Systat Software Inc.).
Techniques: